SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - Application of wavelet de-noise in digital speckle correlation method
Yao, Xuefeng, Jin, Guan-chang, Zhen, Wu, Song, FeiJun, Chen, Frank, Hung, Michael Y.Y., Shang, H.M.Volume:
4221
Year:
2000
Language:
english
DOI:
10.1117/12.402643
File:
PDF, 275 KB
english, 2000