SPIE Proceedings [SPIE 26th Annual International Symposium...

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SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Emerging Lithographic Technologies V - Damage-resistant and low stress EUV multilayer mirrors

Yulin, Sergey A., Kuhlmann, Thomas, Feigl, Torsten, Kaiser, Norbert, Dobisz, Elizabeth A.
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Volume:
4343
Year:
2001
Language:
english
DOI:
10.1117/12.436715
File:
PDF, 607 KB
english, 2001
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