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SPIE Proceedings [SPIE Micromachining and Microfabrication - San Francisco, CA (Monday 22 October 2001)] MOEMS and Miniaturized Systems II - High-frequency raster pinch correction scanner for retinal scanning displays
Urey, Hakan, DeWitt IV, Frank A., Powell, Karlton D., Bayer, Mircea M., Motamedi, M. Edward, Goering, RolfVolume:
4561
Year:
2001
Language:
english
DOI:
10.1117/12.443107
File:
PDF, 1.28 MB
english, 2001