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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Design and Testing - Research of Real-time Measuring System for Veiling Glare Index of Optical System
Liu, Binqi, Zhao, Xilin, Han, Yanzhong, Ling, Jun, Weng, Zhicheng, Sasian, Jose M., Wang, YongtianVolume:
4927
Year:
2002
Language:
english
DOI:
10.1117/12.471664
File:
PDF, 183 KB
english, 2002