SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Surface Scattering and Diffraction III - Analysis of stress measurement by means of a speckle decorrelation
Gu, Zu-Han, Horvath, Pavel, Smid, Petr, Maradudin, Alexei A., Hrabovsky, MiroslavVolume:
5189
Year:
2003
Language:
english
DOI:
10.1117/12.507289
File:
PDF, 493 KB
english, 2003