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SPIE Proceedings [SPIE Optical Technologies for Industrial, Environmental, and Biological Sensing - Providence, RI (Monday 27 October 2003)] Environmental Monitoring and Remediation III - Sensors for chemical risk assessment
Campanella, Luigi, Vo-Dinh, Tuan, Gauglitz, Guenter, Lieberman, Robert A., Schaefer, Klaus P., Killinger, Dennis K.Volume:
5270
Year:
2004
Language:
english
DOI:
10.1117/12.515596
File:
PDF, 742 KB
english, 2004