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SPIE Proceedings [SPIE Rochester - DL tentative - Rochester, NY (Tuesday 1 October 1991)] International Competitiveness and Business Techniques in Advanced Optics and Imaging - Competitiveness and international standardization
Parks, Robert E., Sternberg, Ernest, Krisiloff, Allen J., Schindler, Roland R.Volume:
1617
Year:
1992
Language:
english
DOI:
10.1117/12.58923
File:
PDF, 370 KB
english, 1992