![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Application of super image methods in digital holography
Kornis, Janos, Osten, Wolfgang, Gorecki, Christophe, Gombkoto, Balazs, Novak, Erik L.Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.618632
File:
PDF, 4.92 MB
english, 2005