SPIE Proceedings [SPIE Sixth International Symposium on...

SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Effects of Ti addiction in WO 3 thin film ammonia gas sensor prepared by dc reactive magnetron sputtering

Hu, Ming, Fang, Jiancheng, Wang, Zhongyu, Yong, Cholyun, Feng, Youcai, Lv, Yuqiang, Han, Lei, Liang, Jiran, Wang, Haopeng

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Volume:

6358

Year:

2006

Language:

english

DOI:

10.1117/12.717784

File:

PDF, 183 KB

english, 2006

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