SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Research on some issues of the method of photoelectric autocollimation for two-dimensional small angle measurement
Tan, Qimeng, Ye, Shenghua, Zhang, Guangjun, Yan, Bixi, Lu, Naiguang, Ni, JunVolume:
7160
Year:
2008
Language:
english
DOI:
10.1117/12.806960
File:
PDF, 274 KB
english, 2008