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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors - Nanocrystalline Si-based metal-oxide-semiconductor photodetectors
Yu, Zhenrui, Chen, Xu-yuan, Wang, Yue-lin, Aceves-Mijares, Mariano, Luna Lopez, J. A., Zhou, Zhi-ping, Wang, Qing-kang, Deng, JinxiangVolume:
7381
Year:
2009
Language:
english
DOI:
10.1117/12.833385
File:
PDF, 247 KB
english, 2009