SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - New method of annular sub-apertures stitching
Su, Yun, Zhang, Yudong, Wyant, James C., Wang, Kai, Ruan, Ningjuan, Smythe, Robert A., Wang, Hexin, Li, BoVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.834194
File:
PDF, 547 KB
english, 2008