SPIE Proceedings [SPIE International Conference on Micro-...

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SPIE Proceedings [SPIE International Conference on Micro- and Nano-Electronics 2009 - Zvenigorod, Russian Federation (Monday 5 October 2009)] International Conference on Micro- and Nano-Electronics 2009 - Investigations of nanostructured porous PbTe films with x-ray diffractometry and reflectometry

Zimin, Sergey P., Valiev, Kamil A., Orlikovsky, Alexander A., Vasin, Vladimir M., Gorlachev, Egor S., Petrakov, Anatoly P., Shilov, Sergey V.
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Volume:
7521
Year:
2009
Language:
english
DOI:
10.1117/12.853728
File:
PDF, 268 KB
english, 2009
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