![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference on Micro- and Nano-Electronics 2009 - Zvenigorod, Russian Federation (Monday 5 October 2009)] International Conference on Micro- and Nano-Electronics 2009 - Investigations of nanostructured porous PbTe films with x-ray diffractometry and reflectometry
Zimin, Sergey P., Valiev, Kamil A., Orlikovsky, Alexander A., Vasin, Vladimir M., Gorlachev, Egor S., Petrakov, Anatoly P., Shilov, Sergey V.Volume:
7521
Year:
2009
Language:
english
DOI:
10.1117/12.853728
File:
PDF, 268 KB
english, 2009