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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - Multiresolution analysis of 2D confocal microscope images
Bianchi, D., Gorecki, Christophe, Asundi, Anand K., Vernes, A., Vorlaufer, G., Osten, Wolfgang, Betz, G.Volume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.854498
File:
PDF, 10.22 MB
english, 2010