SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII - Millimeter-order imaging technique from 100 keV to MeV based on germanium Compton camera
Takeda, Shin'ichiro, Burger, Arnold, Franks, Larry A., Fukuchi, Tomonori, Kanayama, Yousuke, James, Ralph B., Motomura, Shinji, Hiromura, Makoto, Takahashi, Tadayuki, Enomoto, ShuichiVolume:
7805
Year:
2010
Language:
english
DOI:
10.1117/12.865333
File:
PDF, 4.99 MB
english, 2010