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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Investigation of fabricating the films in the phase transition regime from amorphous to microcrystalline by MWECR CVD system
Xie, Y. J., Jiang, Ya-Dong, Kippelen, Bernard, Hu, Y. H., Xiao, R. X., Yu, Junsheng, Gao, H., Chen, G. H., Xu, H. J., Chen, Y. C., Wang, L. F.Volume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.866303
File:
PDF, 269 KB
english, 2010