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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing - Study on the property of the light source in the white light optical fiber interferometer
Lee, Yefang, Luo, Xiangang, von Freymann, Georg, Jing, Zhenguo, Hao, Huali, Cheng, Huaqi, Peng, Wei, Yu, QingxuVolume:
7659
Year:
2010
Language:
english
DOI:
10.1117/12.867239
File:
PDF, 400 KB
english, 2010