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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Time and Frequency Metrology III - Overcoming the quantum projection noise (QPN) limit without preparation of the spin-squeezed state
Shiga, N., Ido, Tetsuya, Schibli, Thomas R., Takeuchi, M.Volume:
8132
Year:
2011
Language:
english
DOI:
10.1117/12.892674
File:
PDF, 942 KB
english, 2011