SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Optical System Alignment, Tolerancing, and Verification V - Stray light in PICARD SODISM instrument: design, check, flight results, and alignment issues
Etcheto, P., Sasián, José, Youngworth, Richard N., Meftah, M., Meissonnier, M., Irbah, A., Assus, P., Thuillier, G.Volume:
8131
Year:
2011
Language:
english
DOI:
10.1117/12.896434
File:
PDF, 844 KB
english, 2011