SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Imaging II - X-Ray Fluorescence (XRF) Testing for Thickness in On-Site Controlled Construction of Specialty Coatings
Oakes, Thomas W., Oakes, Robert E., Bowen, D. Keith, Knight, Larry V.Volume:
691
Year:
1986
Language:
english
DOI:
10.1117/12.936627
File:
PDF, 70 KB
english, 1986