SPIE Proceedings [SPIE 31st Annual Technical Symposium - San Diego, CA (Sunday 17 August 1986)] Photomechanics and Speckle Metrology - Fringe Visibility In Electronic Speckle Pattern Interferometry
Yonemura, Motoki, Hagihara, Shigeru, Chiang, Fu-PenVolume:
814
Year:
1987
Language:
english
DOI:
10.1117/12.941719
File:
PDF, 5.30 MB
english, 1987