SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Industrial Laser Interferometry II - Automated Mode Shape Measurement By A Modulated-Fringe Technique Using Electronic Speckle Pattern Interferometry
Sherman, Paul S., Fernandez, Vernon M., Hung, Yau Y., Hung, Y.Y., Pryputniewicz, Ryszard J.Volume:
955
Year:
1988
Language:
english
DOI:
10.1117/12.947676
File:
PDF, 4.38 MB
english, 1988