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SPIE Proceedings [SPIE 22nd Annual Technical Symposium - San Diego (Monday 28 August 1978)] Image Understanding Systems and Industrial Applications I - A Second Generation Automated Edge Match System
Finley, Jack D., Nevatia, RamVolume:
155
Year:
1979
Language:
english
DOI:
10.1117/12.956729
File:
PDF, 13.61 MB
english, 1979