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SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] New Methods in Microscopy and Low Light Imaging - Surface Tension Microscopy
Neumann, Burkhard, Engel, Horst, Schleifenbaum, Bernd, Wampler, John E.Volume:
1161
Year:
1989
Language:
english
DOI:
10.1117/12.962712
File:
PDF, 430 KB
english, 1989