SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - A Software Package For The Analysis Of General Multilayer Performance Data
Peterson, Bryan G., Pew, Hans K., Knight, Larry V., Gaines, David P., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964937
File:
PDF, 286 KB
english, 1986