SPIE Proceedings [SPIE International Topical Meeting on Image Detection and Quality - Paris, France (Wednesday 16 July 1986)] International Topical Meeting on Image Detection and Quality - X-Ray Detection Using A Ccd Device And Its Application To Synchrotron Radiation Imaging And Stress Measurement
Simomaa, K., Kelha, V., Tuomi, T., Korhonen, M. A., Suominen, L., Guyot, Lucien F.Volume:
702
Year:
1987
Language:
english
DOI:
10.1117/12.966761
File:
PDF, 95 KB
english, 1987