X-ray nanotomography and focused-ion-beam sectioning for...

X-ray nanotomography and focused-ion-beam sectioning for quantitative three-dimensional analysis of nanocomposites

Shuck, Christopher E., Frazee, Mathew, Gillman, Andrew, Beason, Matthew T., Gunduz, Ibrahim Emre, Matouš, Karel, Winarski, Robert, Mukasyan, Alexander S.
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Volume:
23
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/s1600577516007992
Date:
July, 2016
File:
PDF, 1.32 MB
english, 2016
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