SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - On-line polymeric measurements in real time with NIR spectroscopy
Brown, Greg K., Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., Rein, Alan J., Sohl, Cary, Todd, Terry R., Weyer, LoisVolume:
1681
Year:
1992
Language:
english
DOI:
10.1117/12.137758
File:
PDF, 206 KB
english, 1992