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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Adhesives Engineering - Measurement of bimaterial interface fracture parameters using modified SEN beam specimens and coherent gradient sensing
Tippur, Hareesh V., Ramaswamy, Sreeganesh, Norland, Eric A., Liechti, Kenneth M.Volume:
1999
Year:
1993
Language:
english
DOI:
10.1117/12.158597
File:
PDF, 410 KB
english, 1993