SPIE Proceedings [SPIE Optical Tools for Manufacturing and...

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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Industrial Optical Sensing and Metrology: Applications and Integration - New computer-controlled polarization phase-shifting technique

Jin, G. C., Bao, Nai-Keng, Chung, Po Sheun, Harding, Kevin G., Stahl, H. Philip
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Volume:
2066
Year:
1993
Language:
english
DOI:
10.1117/12.162092
File:
PDF, 443 KB
english, 1993
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