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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] X-Ray Detector Physics and Applications II - MCP readout for the AXAF-I grating spectrometer
Kenter, Almus T., Goddard, Richard E., Gomes, Joaquim J., Lessing, Joshua, Murray, Stephen S., Moore, Randall W., Roll, Rachel K., Valenza, M., Zombeck, Martin V., Orphan, Victor J.Volume:
2009
Year:
1993
Language:
english
DOI:
10.1117/12.164748
File:
PDF, 432 KB
english, 1993