SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Techniques and Analysis - Phase stepping: application to high-resolution moire
Surrel, Yves, Zhao, Bing, Kwon, Osuk Y., Brown, Gordon M., Kujawinska, MalgorzataVolume:
2003
Year:
1993
Language:
english
DOI:
10.1117/12.165449
File:
PDF, 797 KB
english, 1993