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SPIE Proceedings [SPIE 13th Annual BACUS Symposium on Photomask Technology and Management - Santa Clara, CA (Wednesday 22 September 1993)] 13th Annual BACUS Symposium on Photomask Technology and Management - Universal pattern data format
Rolle, Michael R., Grady, Edward C., Moneta, Jack P.Volume:
2087
Year:
1994
Language:
english
DOI:
10.1117/12.167270
File:
PDF, 676 KB
english, 1994