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SPIE Proceedings [SPIE OE/LASE '94 - Los Angeles, CA (Sunday 23 January 1994)] Spectroscopic Characterization Techniques for Semiconductor Technology V - Photoreflectance study of the chemically modified (100) GaAs surface
Glembocki, Orest J., Tuchman, Judah Ari, Ko, K. K., Pang, Stella W., Dagata, John A., Giordana, Adriana, Kaplan, R., Stutz, Charles E., Glembocki, Orest J.Volume:
2141
Year:
1994
Language:
english
DOI:
10.1117/12.176843
File:
PDF, 603 KB
english, 1994