SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer

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