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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM Grating Spectrometer
Decker, Todd A., Montesanti, Richard C., Bixler, Jay V., Hailey, Charles J., Kahn, Steven M., Fineschi, SilvanoVolume:
2283
Year:
1994
Language:
english
DOI:
10.1117/12.193208
File:
PDF, 765 KB
english, 1994