SPIE Proceedings [SPIE SPIE Optical Engineering +...

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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - SASE3: soft x-ray beamline at European XFEL

Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, La Civita, Daniele, Gerasimova, Natalia, Sinn, Harald, Vannoni, Maurizio
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Volume:
9210
Year:
2014
Language:
english
DOI:
10.1117/12.2061693
File:
PDF, 1.83 MB
english, 2014
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