SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - Ray tracing simulation of 1-BM beamline at the Advanced Photon Source for polarization analyses of synchrotron optics
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Kujala, Naresh, Macrander, Albert, Shi, Xianbo, Reininger, Ruben, Gao, Xuan, Burns, ClementVolume:
9207
Year:
2014
Language:
english
DOI:
10.1117/12.2062577
File:
PDF, 1.15 MB
english, 2014