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SPIE Proceedings [SPIE Semi - DL tentative - San Diego, CA (Thursday 1 March 1990)] Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors - Quantum-well width determination using RHEED oscillations
Koteles, Emil S., Elman, Boris S., Craighead, Harold G., Gibson, J. M.Volume:
1284
Year:
1990
Language:
english
DOI:
10.1117/12.20791
File:
PDF, 224 KB
english, 1990