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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Laser Interferometry VIII: Techniques and Analysis - Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)
Patorski, Krzysztof, Olszak, Artur G., Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Takeda, MitsuoVolume:
2860
Year:
1996
Language:
english
DOI:
10.1117/12.276312
File:
PDF, 531 KB
english, 1996