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SPIE Proceedings [SPIE ISMA '97 International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 23 June 1997)] Automatic Inspection and Novel Instrumentation - Linear pattern identification system
Ting, Antoine, Leung, Maylor K. H., Ho, Anthony T. S., Rao, Sreenivas, Cheng, Lee MingVolume:
3185
Year:
1997
DOI:
10.1117/12.284037
File:
PDF, 679 KB
1997