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SPIE Proceedings [SPIE Non-Destructive Evaluation Techniques for Aging Infrastructure & Manufacturing - San Antonio, TX (Tuesday 31 March 1998)] Process Control and Sensors for Manufacturing - Ultrasonic vibration modal analysis of ICF targets using a photorefractive optical lock-in
Hale, Thomas C., Asaki, Thomas J., Telschow, Kenneth L., Hoffer, Jim, Bossi, Richard H., Pepper, David M.Volume:
3399
Year:
1998
Language:
english
DOI:
10.1117/12.302541
File:
PDF, 460 KB
english, 1998