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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III - Application of holography to real-time dynamic structural analysis of an advanced graphite-epoxy composite flight control component
Fein, Howard, Murrer, Jr., Robert LeeVolume:
3368
Year:
1998
Language:
english
DOI:
10.1117/12.316385
File:
PDF, 3.42 MB
english, 1998