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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - INTEGRAL's Optical Monitoring Camera stray-light design

Mazy, Emmanuel, Defise, Jean-Marc, Plesseria, J.-Y., Gu, Zu-Han, Maradudin, Alexei A.
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Volume:
3426
Year:
1998
Language:
english
DOI:
10.1117/12.328476
File:
PDF, 984 KB
english, 1998
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