SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Laser Metrology and Inspection - Alternative methods for wavelength determination: interference filters and double photodiodes
Bitte, Frank, Pfeifer, Tilo, Tiziani, Hans J., Rastogi, Pramod K.Volume:
3823
Year:
1999
Language:
english
DOI:
10.1117/12.360984
File:
PDF, 1005 KB
english, 1999