![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry
Wang, Guangbin, Hou, Lisong, Gan, Fuxi, Podio, Fernando L.Volume:
3806
Year:
1999
Language:
english
DOI:
10.1117/12.371164
File:
PDF, 193 KB
english, 1999