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SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Optical Pattern Recognition XI - Finding the information of the ellipse from the optical Hough transform
Park, Sang-Gug, Kim, Sung-Young, Kim, Jong-Yun, Kim, Soo-Joong, Casasent, David P., Chao, Tien-HsinVolume:
4043
Year:
2000
Language:
english
DOI:
10.1117/12.381612
File:
PDF, 1.78 MB
english, 2000