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SPIE Proceedings [SPIE Workshop on Nanostructure Science, Metrology, and Technology - Gaithersburg, MD (Wednesday 5 September 2001)] Nanostructure Science, Metrology, and Technology - Nanometer science and technology (Viewgraphs Only)
Murday, James, Peckerar, Martin C., Postek, Jr., Michael T.Volume:
4608
Year:
2002
Language:
english
DOI:
10.1117/12.427109
File:
PDF, 2.51 MB
english, 2002