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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Integrated Optics and Photonic Integrated Circuits - Comparison of three inverse Fourier transform techniques to determine the second-order optical nonlinearity profile of thin films
Ozcan, Aydogan, Righini, Giancarlo C., Honkanen, Seppo, Digonnet, Michel J. F., Kino, Gordon S.Volume:
5451
Year:
2004
Language:
english
DOI:
10.1117/12.548048
File:
PDF, 635 KB
english, 2004