![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - Astigmatism analysis by matrix methods in white cells
Chen, Kexin, Sheng, Yunlong, Wang, Yongtian, Yang, Huaidong, Sun, Liqun, Zeng, Lijiang, Jin, GuofanVolume:
7156
Year:
2008
Language:
english
DOI:
10.1117/12.806947
File:
PDF, 342 KB
english, 2008