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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry
Jia, Dagong, Ye, Shenghua, Zhang, Guangjun, Yu, Changsong, Xu, Tianhua, Ni, Jun, Jin, Chao, Zhang, Hongxia, Jing, Wencai, Zhang, YimoVolume:
7160
Year:
2008
Language:
english
DOI:
10.1117/12.806992
File:
PDF, 1016 KB
english, 2008